Methods of packaging and testing microelectronic imaging...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Packaging or treatment of packaged semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S029000

Reexamination Certificate

active

11409058

ABSTRACT:
Microelectronic imaging devices and methods of packaging microelectronic imaging devices are disclosed herein. In one embodiment, a microelectronic imaging device includes a microelectronic die having an integrated circuit, an image sensor electrically coupled to the integrated circuit, and a plurality of bond-pads electrically coupled to the integrated circuit. The imaging device further includes a cover over the image sensor and a plurality of interconnects in and/or on the cover that are electrically coupled to corresponding bond-pads of the die. The interconnects provide external electrical contacts for the bond-pads of the die. The interconnects can extend through the cover or along a surface of the cover.

REFERENCES:
patent: 3345134 (1967-10-01), Heymer et al.
patent: 4534100 (1985-08-01), Lane
patent: 4906314 (1990-03-01), Farnworth et al.
patent: 5130783 (1992-07-01), McLellan
patent: 5371397 (1994-12-01), Maegawa et al.
patent: 5424573 (1995-06-01), Kato et al.
patent: 5435887 (1995-07-01), Rothschild et al.
patent: 5505804 (1996-04-01), Mizuguchi et al.
patent: 5593913 (1997-01-01), Aoki
patent: 5605783 (1997-02-01), Revelli et al.
patent: 5672519 (1997-09-01), Song et al.
patent: 5694246 (1997-12-01), Aoyama et al.
patent: 5708293 (1998-01-01), Ochi et al.
patent: 5771158 (1998-06-01), Yamagishi et al.
patent: 5776824 (1998-07-01), Farnworth et al.
patent: 5811799 (1998-09-01), Wu
patent: 5821532 (1998-10-01), Beaman et al.
patent: 5857963 (1999-01-01), Pelchy et al.
patent: 5861654 (1999-01-01), Johnson
patent: 5877040 (1999-03-01), Park et al.
patent: 5897338 (1999-04-01), Kaldenberg
patent: 5914488 (1999-06-01), Sone
patent: 5977535 (1999-11-01), Rostoker
patent: 5998862 (1999-12-01), Yamanaka
patent: 6080291 (2000-06-01), Woodruff et al.
patent: 6104086 (2000-08-01), Ichikawa et al.
patent: 6114240 (2000-09-01), Akram et al.
patent: 6143588 (2000-11-01), Glenn
patent: 6236046 (2001-05-01), Watabe et al.
patent: 6259083 (2001-07-01), Kimura
patent: 6266197 (2001-07-01), Glenn et al.
patent: 6274927 (2001-08-01), Glenn
patent: 6285064 (2001-09-01), Foster
patent: 6351027 (2002-02-01), Giboney et al.
patent: 6372548 (2002-04-01), Bessho et al.
patent: 6407381 (2002-06-01), Glenn et al.
patent: 6411439 (2002-06-01), Nishikawa
patent: 6483652 (2002-11-01), Nakamura
patent: 6492699 (2002-12-01), Glenn et al.
patent: 6503780 (2003-01-01), Glenn et al.
patent: 6512219 (2003-01-01), Webster et al.
patent: 6515269 (2003-02-01), Webster et al.
patent: 6541762 (2003-04-01), Knag et al.
patent: 6560047 (2003-05-01), Choi et al.
patent: 6566745 (2003-05-01), Beyne et al.
patent: 6603183 (2003-08-01), Hoffman
patent: 6617623 (2003-09-01), Rhodes
patent: 6661047 (2003-12-01), Rhodes
patent: 6667551 (2003-12-01), Hanaoka et al.
patent: 6670986 (2003-12-01), Ben Shoshan et al.
patent: 6686588 (2004-02-01), Webster et al.
patent: 6703310 (2004-03-01), Mashino et al.
patent: 6864172 (2004-04-01), Noma et al.
patent: 6734419 (2004-05-01), Glenn et al.
patent: 6759266 (2004-07-01), Hoffman
patent: 6774486 (2004-08-01), Kinsman
patent: 6778046 (2004-08-01), Stafford et al.
patent: 6791076 (2004-09-01), Webster
patent: 6795120 (2004-09-01), Takagi et al.
patent: 6797616 (2004-09-01), Kinsman
patent: 6800943 (2004-10-01), Adachi
patent: 6813154 (2004-11-01), Diaz et al.
patent: 6825458 (2004-11-01), Moess et al.
patent: 6828663 (2004-12-01), Chen et al.
patent: 6828674 (2004-12-01), Karpman
patent: 6844978 (2005-01-01), Harden et al.
patent: 6882021 (2005-04-01), Boon et al.
patent: 6885107 (2005-04-01), Kinsman
patent: 6934065 (2005-08-01), Kinsman
patent: 6946325 (2005-09-01), Yean et al.
patent: 2002/0006687 (2002-01-01), Lam
patent: 2002/0057468 (2002-05-01), Segawa et al.
patent: 2002/0089025 (2002-07-01), Chou
patent: 2002/0096729 (2002-07-01), Tu et al.
patent: 2002/0113296 (2002-08-01), Cho et al.
patent: 2002/0145676 (2002-10-01), Kuno et al.
patent: 2003/0062601 (2003-04-01), Harnden et al.
patent: 2004/0012698 (2004-01-01), Suda et al.
patent: 2004/0023469 (2004-02-01), Suda
patent: 2004/0038442 (2004-02-01), Kinsman
patent: 2004/0041261 (2004-03-01), Kinsman
patent: 2004/0082094 (2004-04-01), Yamamoto
patent: 2004/0214373 (2004-10-01), Jiang et al.
patent: 2004/0245649 (2004-12-01), Imaoka
patent: 2005/0052751 (2005-03-01), Liu et al.
patent: 2005/0067681 (2005-03-01), De Villeneuve et al.
patent: 2005/0095835 (2005-05-01), Humpston et al.
patent: 2005/0104228 (2005-05-01), Rigg et al.
patent: 2005/0110889 (2005-05-01), Tuttle et al.
patent: 2005/0127478 (2005-06-01), Hiatt et al.
patent: 2005/0151228 (2005-07-01), Tanida et al.
patent: 2005/0184219 (2005-08-01), Kirby
patent: 2005/0236708 (2005-10-01), Farnworth et al.
patent: 2005/0254133 (2005-11-01), Akram et al.
patent: 0 886 323 (1998-12-01), None
patent: 1 157 967 (2001-11-01), None
patent: 2 835 654 (2003-08-01), None
patent: 59-101882 (1984-06-01), None
patent: 59-191388 (1984-10-01), None
patent: 07-263607 (1995-10-01), None
patent: 2001-077496 (2001-03-01), None
patent: WO-90/05424 (1990-05-01), None
patent: WO-02/075815 (2002-09-01), None
patent: WO-02/095796 (2002-11-01), None
patent: WO-2004/054001 (2004-06-01), None
U.S. Appl. No. 10/785,466, filed Aug. 25, 2005, Kirby.
U.S. Appl. No. 10/845,304, filed Nov. 17, 2005, Jiang et al.
U.S. Appl. No. 10/857,948, filed Dec. 8, 2005, Boettiger et al.
U.S. Appl. No. 10/863,994, filed Dec. 15, 2005, Akram et al.
U.S. Appl. No. 10/864,974, filed Dec. 15, 2005, Kirby et al.
U.S. Appl. No. 10/867,352, filed Dec. 15, 2005, Farnworth et al.
U.S. Appl. No. 10/867,505, filed Dec. 15, 2005, Farnworth et al.
U.S. Appl. No. 10/879,398, filed Dec. 29, 2005, Akram et al.
U.S. Appl. No. 10/879,838, filed Dec. 29, 2005, Kirby et al.
U.S. Appl. No. 10/893,022, filed Jan. 19, 2006, Hall et al.
U.S. Appl. No. 10/894,262, filed Jan. 19, 2006, Farnworth et al.
U.S. Appl. No. 10/901,851, filed Mar. 2, 2006, Derderian et al.
U.S. Appl. No. 10/910,491, filed Feb. 2, 2006, Bolken et al.
U.S. Appl. No. 10/915,180, filed Feb. 16, 2006, Street et al.
U.S. Appl. No. 10/919,604, filed Feb. 16, 2006, Farnworth et al.
U.S. Appl. No. 10/922,177, filed Feb. 23, 2006, Oliver et al.
U.S. Appl. No. 10/922,192, filed Feb. 23, 2006, Farnworth.
U.S. Appl. No. 10/925,406, filed Mar. 2, 2006, Oliver.
U.S. Appl. No. 10/925,501, filed Mar. 2, 2006, Oliver.
U.S. Appl. No. 10/927,550, filed Mar. 2, 2006, Derderian et al.
U.S. Appl. No. 10/927,760, filed Mar. 2, 2006, Chong et al.
U.S. Appl. No. 10/928,598, filed Mar. 2, 2006, Kirby.
U.S. Appl. No. 11/054,692, Boemler.
U.S. Appl. No. 11/056,211, Hembree et al.
U.S. Appl. No. 11/056,484, Boettiger et al.
U.S. Appl. No. 11/061,034, Boettiger.
U.S. Appl. No. 11/146,783, Tuttle et al.
U.S. Appl. No. 11/169,546, Sulfridge.
U.S. Appl. No. 11/169,838, Sulfridge.
U.S. Appl. No. 11/177,905, Akram.
U.S. Appl. No. 11/209,524, Akram.
U.S. Appl. No. 11/217,169, Hiatt et al.
U.S. Appl. No. 11/217,877, Oliver et al.
U.S. Appl. No. 11/218,126, Farnworth et al.
U.S. Appl. No. 11/218,243, Kirby et al.
Aachboun, S. and P. Ranson, “Cryogenic etching of deep narrow trenches in silicon,” J. Vac. Sci. Technol. A 18(4), Jul./Aug. 2000, pp. 1848-1852.
Aachboun, S. and P. Ranson, “Deep anisotropic etching of silicon,” J. Vac. Sci. Technol. A 17(4), Jul./Aug. 1999, pp. 2270-2273.
Austin, M.D. and S.Y. Chou, “Fabrication of 70 nm channel length polymer organic thin-film transistors using nanoimprint lithography,” Applied Physics Letters, vol. 81, No. 23, pp. 4431-4433, Dec. 2, 2002, American Institute of Physics.
Blackburn, J.M. et al., “Deposition of Conformal Copper and Nickel Films from Supercritical Carbon Dioxide,” Science, vol. 294, pp. 141-145, Oct. 5, 2001.
Brubaker, C. et al., “Ultra-thick Lithography for Advanced Packaging and MEMS,” SPIE's 27th Annual International Symposium on Microlithography 2002, Mar. 3-8, 2002, Santa Clara, CA.
Cheng, Yu-T. et al., “Vacuum Packaging Technology Using Localized Aluminum/Silicon-to-Glass Bonding,” Journal of Microelectromechanical Systems, vol. 11, No. 5, pp. 55

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of packaging and testing microelectronic imaging... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of packaging and testing microelectronic imaging..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of packaging and testing microelectronic imaging... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3944944

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.