Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2010-02-22
2011-10-04
Mai, Son (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185180, C365S185280, C365S185290, C365S185330, C257S316000, C257S318000, C257SE29300
Reexamination Certificate
active
08031532
ABSTRACT:
Flash memory device structures and methods of manufacture thereof are disclosed. The flash memory devices are manufactured on silicon-on-insulator (SOI) substrates. Shallow trench isolation (STI) regions and the buried oxide layer of the SOI substrate are used to isolate adjacent devices from one another. The methods of manufacture require fewer lithography masks and may be implemented in stand-alone flash memory devices, embedded flash memory devices, and system on a chip (SoC) flash memory devices.
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Shum Danny Pak-Chum
Tilke Armin
Yan Jiang
Infineon - Technologies AG
Mai Son
Slater & Matsil L.L.P.
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