Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2007-03-27
2007-03-27
Rosasco, S. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S330000
Reexamination Certificate
active
10724734
ABSTRACT:
A photomask blank having a film of at least one layer formed on a substrate is manufactured by forming a film on a substrate and irradiating the film with light from a flash lamp. A photomask is manufactured from the thus manufactured photomask blank by forming a patterned resist on the film on the blank by photolithography, etching away those portions of the film which are not covered with the resist, and removing the resist. The photomask blank and photomask have minimized warpage and improved chemical resistance.
REFERENCES:
patent: 4619894 (1986-10-01), Bozler et al.
patent: 5907393 (1999-05-01), Kawano et al.
patent: 6376806 (2002-04-01), Yoo
patent: 6677087 (2004-01-01), Nozawa et al.
patent: 6746806 (2004-06-01), Nozawa
patent: 6770519 (2004-08-01), Ito et al.
patent: 6806021 (2004-10-01), Sato et al.
patent: 2002/0058186 (2002-05-01), Nozawa et al.
patent: 1 132 772 (2001-12-01), None
patent: 7-140635 (1995-02-01), None
Inazuki Yukio
Kaneko Hideo
Mogi Masayuki
Okumura Katsuya
Tsukamoto Tetsushi
Rosasco S.
Shin-Etsu Chemical Co. , Ltd.
LandOfFree
Methods of manufacturing photomask blank and photomask does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of manufacturing photomask blank and photomask, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of manufacturing photomask blank and photomask will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3743223