Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2006-06-06
2006-06-06
Huff, Mark F. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C216S012000
Reexamination Certificate
active
07056624
ABSTRACT:
Methods of manufacturing a single sided engraving phase shift mask that includes a shifter part and a non-shifter part mutually adjacent on a substrate, and a shading layer pattern formed with a shading film and wherein a side wall part of a dug-down part has round, crooked portions at top and bottom corners of the sidewall part. The method includes forming a resist pattern having a selective opening at the shifter part, forming a dug-down part corresponding to the shifter part by using the resist pattern, wet etching the whole surface at the dug-down part forming side of the substrate, forming a shading film on the substrate, forming a resist pattern on the shading film, and forming a shading pattern having prescribed openings at the shifter part and non-shifter part.
REFERENCES:
patent: 5397665 (1995-03-01), Tabuchi et al.
patent: 5965301 (1999-10-01), Nara et al.
patent: 6251549 (2001-06-01), Levenson
patent: 6340542 (2002-01-01), Inoue et al.
patent: 0650090 (1995-04-01), None
patent: 650090 (1995-04-01), None
patent: 56-133737 (1981-10-01), None
patent: 05-303190 (1993-11-01), None
Levinson, Harry J., Principles of Lithography, 2001, SPIE—The International Society for Optical Engineering, p. 274.
Dai Nippon Printing Co. Ltd.
Huff Mark F.
Ladas & Parry LLP
Ruggles John
LandOfFree
Methods of manufacturing phase shift masks having etched... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of manufacturing phase shift masks having etched..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of manufacturing phase shift masks having etched... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3622720