Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2007-09-18
2007-09-18
Le, Dung A. (Department: 2818)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S238000, C438S318000, C257S295000, C257SE27104
Reexamination Certificate
active
11262054
ABSTRACT:
Techniques are provided for sensing a first current produced by an active circuit component. According to these techniques, a current sensor is disposed over the active circuit component. The current sensor includes a Magnetic Tunnel Junction (“MTJ”) core disposed between a first conductive layer and a second conductive layer. The MTJ core can be used to sense the first current and produce a second current based on the first current sensed at the MTJ core.
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Baird Robert W.
Chung Young Sir
Durlam Mark A.
Freescale Semiconductor Inc.
Le Dung A.
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