Methods of forming silicon nanocrystals by laser annealing

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C117S088000, C117S098000, C117S099000, C117S100000, C117S101000, C117S102000, C117S103000, C117S104000, C117S105000, C977S784000, C977S809000, C977S814000, C977S844000, C977S890000, C977S891000

Reexamination Certificate

active

07857907

ABSTRACT:
The present invention relates to a method for forming a layered structure with silicon nanocrystals. In one embodiment, the method comprises the steps of: (i) forming a first conductive layer on a substrate, (ii) forming a silicon-rich dielectric layer on the first conductive layer, and (iii) laser-annealing at least the silicon-rich dielectric layer to induce silicon-rich aggregation to form a plurality of silicon nanocrystals in the silicon-rich dielectric layer. The silicon-rich dielectric layer is one of a silicon-rich oxide film having a refractive index in the range of about 1.4 to 2.3, or a silicon-rich nitride film having a refractive index in the range of about 1.7 to 2.3. The layered structure with silicon nanocrystals in a silicon-rich dielectric layer is usable in a solar cell, a photodetector, a touch panel, a non-volatile memory device as storage node, and a liquid crystal display.

REFERENCES:
patent: 5994157 (1999-11-01), Aggas et al.
patent: 6164958 (2000-12-01), Huang et al.
patent: 6184158 (2001-02-01), Shufflebotham et al.
patent: 6326311 (2001-12-01), Ueda et al.
patent: 6410412 (2002-06-01), Taira et al.
patent: 6483861 (2002-11-01), Moon
patent: 6544870 (2003-04-01), Park et al.
patent: 6597496 (2003-07-01), Nayfeh et al.
patent: 6710366 (2004-03-01), Lee et al.
patent: 6846474 (2005-01-01), Nayfeh et al.
patent: 6888200 (2005-05-01), Bhattacharyya
patent: 6984842 (2006-01-01), Nayfeh et al.
patent: 6992298 (2006-01-01), Nayfeh et al.
patent: 7087537 (2006-08-01), Joshi et al.
patent: 7184312 (2007-02-01), Bhattacharyya
patent: 7259106 (2007-08-01), Jain
patent: 7339830 (2008-03-01), Bhattacharyya
patent: 7381595 (2008-06-01), Joshi et al.
patent: 7446023 (2008-11-01), Joshi et al.
patent: 7521292 (2009-04-01), Rogers et al.
patent: 7544625 (2009-06-01), Joshi et al.
patent: 2004/0041206 (2004-03-01), Bhattacharyya
patent: 2004/0106285 (2004-06-01), Zacharias
patent: 2005/0026353 (2005-02-01), Bhattacharyya
patent: 2006/0043383 (2006-03-01), Yang et al.
patent: 2006/0189014 (2006-08-01), Li et al.
patent: 2006/0194454 (2006-08-01), Hughes et al.
patent: 2006/0211267 (2006-09-01), Joshi et al.
patent: 2006/0286785 (2006-12-01), Rogers et al.
patent: 2007/0138555 (2007-06-01), Bhattacharyya
patent: 2008/0048240 (2008-02-01), Kamath et al.
patent: 2008/0178794 (2008-07-01), Cho et al.
patent: 2008/0179762 (2008-07-01), Cho et al.
patent: 2009/0009675 (2009-01-01), Cho et al.
patent: 2009/0191680 (2009-07-01), Walker
patent: 2009/0232449 (2009-09-01), Zhang et al.
patent: 2009/0280606 (2009-11-01), Shih et al.
patent: 2009/0294028 (2009-12-01), Heck et al.
Rosmeulen, M. et al., “Electrical Characterisation of Silicon-Rich-Oxide Based Memory Cells Using Pulsed Current-Voltage Techniques,”Essderc, pp. 471-474, IMEC, Kapeldreef 75, 3001 Leuven, Belgium (2002).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of forming silicon nanocrystals by laser annealing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of forming silicon nanocrystals by laser annealing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of forming silicon nanocrystals by laser annealing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4188796

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.