Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Reexamination Certificate
2007-12-25
2007-12-25
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making passive device
Stacked capacitor
C438S438000, C438S239000, C438S253000, C438S254000, C438S396000, C438S381000
Reexamination Certificate
active
10977385
ABSTRACT:
Methods of forming capacitor structures may include forming an insulating layer on a substrate, forming a first capacitor electrode on the insulating layer, forming a capacitor dielectric layer on portions of the first capacitor electrode, and forming a second capacitor electrode on the capacitor dielectric layer such that the capacitor dielectric layer is between the first and second capacitor electrodes. More particularly, the first capacitor electrode may define a cavity therein wherein the cavity has a first portion parallel with respect to the substrate and a second portion perpendicular with respect to the substrate. Related structures are also discussed.
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English Translation of Korean Office Action for Application No. 10/2002-0029494 dated May 28, 2004.
Cho Sung-Il
Chung Eun-Ae
Ghi Kyeong-Koo
Kang Chang-Jin
Kim Dong-Chan
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