Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-12-27
2005-12-27
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S076000, C702S075000, C370S480000
Reexamination Certificate
active
06980913
ABSTRACT:
A method, apparatus, and system for spectrum analysis. The method, apparatus, and system for spectrum analysis include measuring energy incident at a frequency in a frequency spectrum corresponding to a channel, but not all frequencies in the frequency spectrum, and determining whether the energy measured at the frequency exceeds a valid channel threshold.
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patent: 6804262 (2004-10-01), Vogel et al.
patent: 2004/0203392 (2004-10-01), Hsu et al.
Buckley Maschoff & Talwalkar LLC
Wachsman Hal
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