Methods of detecting, classifying and quantifying defects in opt

Optics: measuring and testing – For optical fiber or waveguide inspection

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356237, 382 1, 382 8, G01N 2184

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active

051794195

ABSTRACT:
Methods are provided to detect, classify and quantify defects such as chips, pits, scratches and cracks in a polished end surface (31) of optical fiber and specifically in an end face of an optical fiber terminated by a ferrule (34). Images of the end face are acquired at each of three focal positions which collectively include all the features of interest. Information from these images is combined into a single image which is processed further. Discrepancies between the images are used to discriminate between cracks and scratches. Morphological processing is used to segment the fiber from its ferrule and a Hough transform is used to estimate the center and radius of the optical fiber, which facilitates the isolation of the fiber. Chips and pits in the fiber end face are detected and quantified by thresholding and morphological processing of the isolated fiber. Edge detection is used to detect edge segments resulting from scratches and cracks. Then the line segments are classified into scratches and cracks. The detected segments are matched to provide scratches in a final image. Quantitative measures then are used to establish standards for the quality of the polished, terminated optical fibers.

REFERENCES:
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patent: 4802726 (1989-02-01), Palmquist et al.
John Kesterson & Mike Richardson, Confocal Microscope Capability with Desktop Affordability, Advanced Imaging, Oct. 1991, at 23-26.
Cliff Glier, Automated Machine Vision Microscopy for the Biologist, Advanced Imaging, Oct. 1991, pp. 18-22.
Behzad Shahraray, et al., Defect Detection, Classification and Quantification in Optical Fiber Connectors, IAPR Workshop on Machine Vision Applications, Nov. 1990, pp. 15-22.

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