Methods of array synthesis

Chemistry: molecular biology and microbiology – Measuring or testing process involving enzymes or... – Involving nucleic acid

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C435S007100, C435S091500, C436S164000, C436S524000, C436S527000, C530S334000, C530S335000, C536S025300, C536S025310

Reexamination Certificate

active

06887665

ABSTRACT:
Radiation-activated catalysts (RACs), autocatalytic reactions, and protective groups are employed to achieve a highly sensitive, high resolution, radiation directed combinatorial synthesis of pattern arrays of diverse polymers. When irradiated, RACs produce catalysts that can react with enhancers, such as those involved in autocatalytic reactions. The autocatalytic reactions produce at least one product that removes protecting groups from synthesis intermediates. This invention has a wide variety of applications and is particularly useful for the solid phase combinatorial synthesis of polymers.

REFERENCES:
patent: 4705729 (1987-11-01), Sheats
patent: 5143854 (1992-09-01), Pirrung et al.
patent: 5288514 (1994-02-01), Ellman
patent: 6040138 (2000-03-01), Lockhart et al.
patent: 6083697 (2000-07-01), Beecher et al.
patent: 6159681 (2000-12-01), Zebala
patent: 6174998 (2001-01-01), Muhlegger et al.
patent: 6426184 (2002-07-01), Gao et al.
patent: WO 97103 65 (1996-09-01), None
patent: WO 9820967 (1998-05-01), None
Griffling and West IEEE Electron Device Letters EDL-4(1): 14 (1983).
Ghandi, VLSI Fabrication Principles, 1983, Chapter 10.
Hofer et al., Contrast enhanced uv lithography with polysilanes, Advances in Resist Technology, 1984, 108-16, SPIE vol. 489.
Halle, L., et al., J. Vac. Sci. Technol. B., 1985, 323-326, vol. 3(1).
Sheats, et al., J. Vac. Sci. Technol. B., 1985, 323-326, vol. 3(1).
Uchne, et al., Proc. Poly. Mat. Sci. and Eng., 1986, 55, 604-607.
Paul R. West, et al., Contrast Enhanced Photolithography; Application of Photobleaching Processes in Microlithography, J. Imaging Science, Mar./Apr. 1986, 65-68, vol. 20, No. 2.
Don R. Strom, Optical Lithography and Contrast Enhancement, Semiconductor International, May 1986, 182-87.
Endo, et al., High aspect-ratio resist pattern fabrication by alkaline surface treatment, J. Vac. Sci. Technol. B., 1989, 1076-79, vol. 7(5).
Uchino, Shou-ichi et al., Synthesis of new metal-free diazonium salts and their applications to microlithigraphy, Journal of Photopolymer Science and Technology (1989); 2(1): 255-299.
Reiser, et al., Photoreactive Polymers: the Science and technology of Resists, 1989, 228-29.
Salamy, et al., Proc. Electrochem. Soc. 1989, 90:36.
Durand, et al., Nucleic Acids Res., 1990, 6353-59, vol. 18., No. 21.
Toshihiko Tanaka, et al., Sub-Halfmicron Lithography Using a High-Contrast-Line CEL, Japanese J. Applied Physics, Sep. 1990, 1880-61, vol. 29, No. 1.
R. Rforr, et al., Contrast enhancement of the resist latent image using exposure induced absorption amplification -fundamental, modeling, and applicability, Microelectronic Engineering, 1992, 321-328, vol. 17.
David M. Teegarden, et al., Contrast Enhancement Lithography System Based on Pyrylium Dye Bleach Chemistry, J. Imaging Science and Technology, 1993, 149-155, vol. 37, No. 2.
Thompson, L.F., et al., Introduction to Microlithography, America Chemical Society, 1994 212-232.
Huang, Proc. SPIE -Int. Soc. Opt. Eng., 1999, 3678, (Pt. 2) 340-51.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods of array synthesis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of array synthesis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of array synthesis will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3420057

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.