Methods of and apparatus for measuring picosecond semiconductor

Details Methods of and apparatus for measuring picosecond semiconductor Methods of and apparatus for measuring picosecond semiconductor

1986-07-14

1988-09-20

Rosenberger, R. A.

Optics: measuring and testing

Lamp beam direction or pattern

356213, G01J 100

Patent

active

047721189

ABSTRACT:
The duration of a very short semiconductor laser pulse, such as that ranging from a fraction to hundreds to picoseconds, can be measured utilizing the internally generated second harmonic emission of the laser. A laser diode is driven so that light emitted therefrom can pass through a beam splitter and be reflected by the beam-splitter into a photomultiplier and into a detector, respectively. Signals received therefrom relate to the conversion efficiency of the second harmonic emission generated by the picosecond pulses and of either continuous wave emission or pulse emission whose durations can be accurately measured by photodetectors. Apparatus includes a photodiode for measuring the fundamental laser power, a photomultiplier for measuring the second harmonic power, and appropriate filters. Ammeters coupled to the photodiode and photomultiplier measure the appropriate current. The ratio of the current can be determined by a ratio circuit or a computer.

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D. A. Angelov, G. G. Gurzadyan, D. N. Nikogosyn, Generation of high-power Picosecond Pulses of 218-316 nm Wavelengths, Oct. 1979, 1334-5 Sov. I. Quantum 9(10).
J. Wiedmann et al., Determination of the Shape and Duration of Picosecond Light Pulses by Bleaching of Dyes, Jul.-79, 107-112, Optics Communications vol. 30, #1.

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