Methods for the fabrication of microelectronic device...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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C257S734000, C257SE21505, C361S748000, C174S262000

Reexamination Certificate

active

08067266

ABSTRACT:
The present disclosure relates to fabricating substrates for use in microelectronic device packages. In at least one embodiment, two substrate cores may be attached together during build-up layer formation on each substrate core to increase substrate fabrication throughput. The embodiments of the present disclosure may allow the processing of relatively thin substrates.

REFERENCES:
patent: 6580036 (2003-06-01), Kim et al.
patent: 6696764 (2004-02-01), Honda
patent: 6988312 (2006-01-01), Nakamura et al.
patent: 7093356 (2006-08-01), Imafuji et al.
patent: 7346982 (2008-03-01), Kim et al.
patent: 7543374 (2009-06-01), Nakamura
patent: 7736457 (2010-06-01), Iwata
patent: 7737366 (2010-06-01), Shirai et al.
patent: 7841076 (2010-11-01), Fujii
patent: 2004/0198033 (2004-10-01), Lee et al.
patent: 2004/0211751 (2004-10-01), Shuto et al.
patent: 2009/0250259 (2009-10-01), Mok et al.

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