Methods for testing durable optical elements

Details Methods for testing durable optical elements Methods for testing durable optical elements

2007-10-30

2007-10-30

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

C356S626000, C356S237100

Reexamination Certificate

active

10938006

ABSTRACT:
A method includes providing a polymerized optical film structure having a microstructured surface, forming a scratch having a length on the microstructured surface to form a scratched optical film, illuminating the scratched optical film to form an illuminated scratch, measuring a plurality of scratch contrast ratio values along the length of the illuminated scratch with a detector, and determining a maximum scratch contrast ratio from the plurality of scratch contrast ratio values along the length of the scratch.

REFERENCES:
patent: 4487904 (1984-12-01), Fukuda et al.
patent: 4542449 (1985-09-01), Whitehead
patent: 4568445 (1986-02-01), Cates et al.
patent: 4721377 (1988-01-01), Fukuda et al.
patent: 4812032 (1989-03-01), Fukuda et al.
patent: 4931523 (1990-06-01), Watanabe et al.
patent: 5183870 (1993-02-01), Fukushima et al.
patent: 5626600 (1997-05-01), Horzewski et al.
patent: 5883607 (1999-03-01), Williams
patent: 5965896 (1999-10-01), Marton
patent: 6107364 (2000-08-01), Fong et al.
patent: 6111696 (2000-08-01), Allen et al.
patent: 6218074 (2001-04-01), Dueber et al.
patent: 6280063 (2001-08-01), Fong et al.
patent: 6329058 (2001-12-01), Arney et al.
patent: 6355754 (2002-03-01), Olson et al.
patent: 6356391 (2002-03-01), Gardiner et al.
patent: 6359170 (2002-03-01), Olson
patent: 6368682 (2002-04-01), Fong
patent: 6376590 (2002-04-01), Kolb et al.
patent: 6432526 (2002-08-01), Arney et al.
patent: 6521677 (2003-02-01), Yashiro et al.
patent: 6541591 (2003-04-01), Olson et al.
patent: 6593392 (2003-07-01), Wang
patent: 6656990 (2003-12-01), Shustack et al.
patent: 6727309 (2004-04-01), Paiva et al.
patent: 6795201 (2004-09-01), Rangarajan et al.
patent: 2003/0100693 (2003-05-01), Olson et al.
patent: 2003/0129385 (2003-07-01), Hojo et al.
patent: 2003/0175004 (2003-09-01), Garito et al.
patent: 2003/0179371 (2003-09-01), Rangarajan et al.
patent: 2003/0180029 (2003-09-01), Garito et al.
patent: 2004/0132858 (2004-07-01), Chisholm et al.
patent: 2004/0229059 (2004-11-01), Kausch et al.
patent: 2005/0049325 (2005-03-01), Chisholm et al.
patent: 0 089 041 (1987-11-01), None
patent: 1 014 113 (2000-06-01), None
patent: 1 510 557 (2005-03-01), None
patent: 2-132567 (1990-05-01), None
patent: 2002365234 (2002-12-01), None
patent: WO96/19347 (1996-06-01), None
patent: WO98/50442 (1998-11-01), None
patent: WO98/50805 (1998-11-01), None
patent: WO 00/06495 (2000-02-01), None
patent: WO 00/14050 (2000-03-01), None
patent: WO 01/29138 (2001-04-01), None
patent: WO 01/51539 (2001-07-01), None
patent: WO 02/00594 (2002-01-01), None
patent: WO 02/051892 (2002-07-01), None
patent: WO 03/033558 (2003-04-01), None

Affiliated with

Also associated with

Rating

Methods for testing durable optical elements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for testing durable optical elements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for testing durable optical elements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3829729