Methods for residue removal and corrosion prevention in a...

Abrading – Abrading process – Utilizing fluent abradant

Reexamination Certificate

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C134S001000, C451S057000

Reexamination Certificate

active

07134941

ABSTRACT:
A method of plasma assisted CO2cleaning for dry removal of residual photoresist and sidewall polymer with an etch gas mixture comprising fluorine containing gas, oxygen and hydrogen in N2or H2O. The process removes polymer residues present on a metal layer on a substrate and on the sidewalls of metal lines and inhibits chlorine-based corrosion while being very selective to exposed Ti, TiN, Al and SiO2. The invention is particularly suited for removing post metal etch polymer residue from top and sidewall of metal lines.

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High Pressure Cleaning System for Disks, IBM Technical Disclosure Bulletin, Jan. 1983.

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