Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2006-12-05
2006-12-05
Blum, David S. (Department: 2813)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S051000, C438S116000
Reexamination Certificate
active
07144745
ABSTRACT:
A method of producing a crystalline substrate based device includes forming a microstructure on a crystalline substrate. At least one packaging layer is sealed over the microstructure by an adhesive and defines therewith at least one gap between the crystalline substrate and the at least one packaging layer.
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Blum David S.
Lerner,David,Littenberg,Krumholz & Mentlik, LLP
Tessera Technologies Hungary Kft.
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