Methods for optimizing thin film formation with reactive gases

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S753000, C438S474000, C438S475000, C257SE21170, C257SE21102, C257SE21115, C257SE21319, C257SE21347

Reexamination Certificate

active

07572740

ABSTRACT:
A method for producing a Group IV semiconductor thin film in a chamber is disclosed. The method includes positioning a substrate in the chamber, wherein the chamber further has a chamber pressure. The method further includes depositing a nanoparticle ink on the substrate, the nanoparticle ink including set of Group IV semiconductor nanoparticles and a solvent, wherein each nanoparticle of the set of Group IV semiconductor nanoparticles includes a nanoparticle surface, wherein a layer of Group IV semiconductor nanoparticles is formed. The method also includes striking a hydrogen plasma; and heating the layer of Group IV semiconductor nanoparticles to a fabrication temperature of between about 300° C. and about 1350° C., and between about 1 nanosecond and about 10 minutes; wherein the Group IV semiconductor thin film is formed.

REFERENCES:
patent: 4040849 (1977-08-01), Greskovich et al.
patent: 4262631 (1981-04-01), Kubacki
patent: 4330358 (1982-05-01), Grabmaier et al.
patent: 4407858 (1983-10-01), Hanke et al.
patent: 4876218 (1989-10-01), Pessa et al.
patent: 4910167 (1990-03-01), Lee et al.
patent: 5057163 (1991-10-01), Barnett et al.
patent: 5141893 (1992-08-01), Ito et al.
patent: 5262357 (1993-11-01), Alivisatos et al.
patent: 5336335 (1994-08-01), Hall et al.
patent: 5556791 (1996-09-01), Stevens et al.
patent: 5576248 (1996-11-01), Goldstein
patent: RE36156 (1999-03-01), Hall et al.
patent: 5958329 (1999-09-01), Brown
patent: 6080606 (2000-06-01), Gleskova et al.
patent: 6111191 (2000-08-01), Hall et al.
patent: 6559479 (2003-05-01), Lüdemann
patent: 6623559 (2003-09-01), Huang
patent: 6688494 (2004-02-01), Pozarnsky et al.
patent: 6878871 (2005-04-01), Scher et al.
patent: 6984265 (2006-01-01), Raguse et al.
patent: 7446335 (2008-11-01), Kortshagen et al.
patent: 2002/0192956 (2002-12-01), Kizilyalli Isik et al.
patent: 2003/0003300 (2003-01-01), Korgel et al.
patent: 2003/0226498 (2003-12-01), Alivisatos et al.
patent: 2005/0005851 (2005-01-01), Keshner et al.
patent: 2005/0008880 (2005-01-01), Kunze et al.
patent: 2005/0104125 (2005-05-01), Sato et al.
patent: 2005/0126628 (2005-06-01), Scher et al.
patent: 2006/0051505 (2006-03-01), Kortshagen et al.
patent: 2006/0154036 (2006-07-01), Kunze et al.
patent: 2006/0237719 (2006-10-01), Colfer et al.
patent: 2008/0160265 (2008-07-01), Hieslmair et al.
patent: 2008/0160733 (2008-07-01), Hieslmair et al.
patent: 19904082 (2000-08-01), None
patent: 1048564 (1966-11-01), None
patent: 1077224 (1967-07-01), None
patent: WO 2004/023527 (2004-03-01), None
patent: WO 2006/096201 (2006-09-01), None
patent: WO 2008/039757 (2008-04-01), None
patent: WO 2008/073763 (2008-06-01), None
patent: WO 2008/076744 (2008-06-01), None
International Search Report for PCT/US2008/059038 dated Jul. 18, 2008.
Christiansen, T. et al., “Standard Operating Procedure: Spin-on-Glass Surface Level Characterization,” Jun. 8, 2000.
Jang, W. I. et al., “Fabrication of MEMS Devices by Using Anhydrous HF Gas-phase Etching with Alcoholic Vapor”J. Micromech. Microeng., vol. 12, 2002, pp. 297-306; published by IOP Publishing Ltd.
Kubacki, R. M., “Low Temperature Plasma Deposition of Silicon Nitride to Produce Ultra-Reliable, High Performance, Low Cost Sealed Chip-on-Board (SCOB) Assemblies”IEEE Transactions on Components, Packaging, and Manufacturing Technology—Part A, vol. 18, No. 3, Sep. 1995 pp. 471-477.
Lee, J. H. et al, “Gas-Phase Etching of Sacrificial Oxides Using Annhydrous HF and CH3OH,” 10thAnnual International Workshop on MEMS,IEEE, Jan. 26-30, 1997, pp. 448-453.
Orfert, M. et al., “Plasma Enhanced Chemical Vapor Deposition of SiN-films For Passivation of Three-Dimensional Substrates,”Surface and Coatings Technology116-119, 1999, pp. 622-628; published by Elsevier Science S.A.
Schmid, P. et al, “Plasma Deposition of Si-N and Si-O Passivation Layers on Three-Dimensional Sensor Devices,”Surface and Coating Technology98, 1998, pp. 1510-1517; published by Elsevier Science S.A.
D. V. Melnikov et al., “Quantum Confinement in Phosphorous-Doped Silicon Nanocrystals,”Physical Review Letters, vol. 92 (2004), pp. 046802-1-046802-4.
Y. H. Tang et al., “Microstructure and Filed-Emission Characteristics of Boron-Doped SI Nanoparticle Chains,”Applied Physics Letters, vol. 79 (2001), pp. 1673-1675.
T. Ifuku et al., “Fabrication of Nanocrystalline Silicon with Small Spread of Particle Size by Pulsed Gas Plasma,”Japanese Journal of Applied Physics, vol. 36 (1997), pp. 4031-4034.
A. N. Goldstein, “The Melting of Silicon Nanocrystals: Submicron Thin-film Structures Derived from Nanocrystal Precursors,”Applied Physics A, V. 62 (1996) pp. 33-37.
Ai et al., “Preparaation and characterization of Si sheets by renewed SSP technique,”Journal of Crystal Growth, vol. 270 (2004), pp. 446-454.
Q. Ban, et al., “Substrate Materials for Poly-CSiTF Solar Cells: Optimization of Silicon Sheet from Powder,”Acta Metallurgica Sinica, vol. 18, No. 3 (Jun. 2005), pp. 184-188.
Q Ban et al., “Study on Preparation Technology of Polycrystalline Silicon Thin Film Solar Cells Based on SSP Substrate,”Acta Energiae Solaris Sinica, vol. 25, No. 1 (Feb. 2004), pp. 95-98.
Bet et al., “Laser Forming of Silicon Films Using Nanoparticle Precursor,”Journal of Electronic Materials, vol. 35, No. 5 (2006), pp. 993-1004.
Britton, D.T. and M. Härting, “Printed Nanoparticulate Composites for Silicon Thick Film Electronics,”Pure and Applied Chemistry, vol. 78, No. 9 (2006), 1723-1739.
Ghosh et al., “Theory of the electrical and photovoltaic properties of polycrystalline silicon,”Journal of Applied Physics, vol. 51, No. 1 (1980) pp. 446-454.
Grovenor, C R M, “Grain boundaries in semiconductors,”J. Phys. C: Solid State Phys., vol. 18 (1985), pp. 4079-4119.
Liang et al, “Characterisation of direct epitaxial silicon thin film solar cells on a low-cost substrate,”Solar Energy Materials&Solar Cells, vol. 80 (2003), pp. 181-193.
Mataré, H.F., “Carrier transport at grain boundaries in semiconductors,”Journal of Applied Physics, vol. 56, No. 10 (1984), pp. 2605-2631.
McCann et al, “A Review of Thin Film Crystalline Silicon for Solar Cell Applications. Part 1: Native Substrates,”Solar Energy Materials and Solar Cells, vol. 68, No. 2 (May 2001), pp. 135-171.
Möller et al., “Sintering of Ultrafine Silicon Powder,”Journal of the American Ceramic Society, vol. 68, No. 6 (1985), pp. 320-325.
Yang et al., “Effect of pressure on melting temperature of silicon,”Journal of Physics: Condensed Matter, vol. 15 (2003), pp. 4961-4965.
“Crystalline Silicon Thin-Film Solar Cells,” a Product Information Sheet published by Fraunhofer Institut Solare Energie Systeme, Oct. 2001, pp. 1-6.
T. Shiga et al., “Photovoltaic performance and stability of CdTe/polymeric hybrid solar cells using a C60 buffer layer,”Solar Energy Materials and Solar Cells, vol. 90, No. 12, (Jan. 2006), pp. 1849-1858; published by Elsevier Science Publishers, Amsterdam, NL.
J. R. Heath et al., “Nanocrystals Seeding: A Low Temperature Route to Polycrystaline Si Films,”Applied Phys. Lett., vol. 64, No. 26 (Jun. 27, 1994), pp. 3569-3571.
G. Samdani et al., “Tiny Particles Aim for Big Markets,”Chemical Eng., Aug. 1994, pp. 35-39.
Goldstein et al., “Melting in Semiconductor Nanocrystals,” vol. 256, Jun. 1992, pp. 1425-1427.
Buffat et al., “Size Effect on the Melting Temperature of Gold Particles,”Physical Review A, Jun. 1976.
Ercolessi et al., “Melting of Small Gold Particles: Mechanism and Size Effects,”Physical Review Letters, vol. 66, No. 7 (Feb. 1991).
M. Wautelet, “Estimation of the Variation of the Melting Temperature with the Size of Small Particles . . . ,”J. Phys. D: Appl Phys, vol. 24 (1991), pp. 343-346.
Berry et

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