Methods for measuring sample resistance in electroporation

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S691000, C606S034000, C435S285200

Reexamination Certificate

active

07576549

ABSTRACT:
Systems and methods of measuring resistances of samples to be electroporated and utilizing the measured resistances in the electroporation are provided. During an electrical pulse sent to the sample, a time and a corresponding voltage drop on a known capacitance is measured to determine the sample resistance. A constant voltage may be assumed, and the voltage drop across a known resistance in series with the sample resistance is used to determine the sample resistance. Based on the value of the sample resistance, an electrical pulse may be altered by changing a value of a parallel resistance.

REFERENCES:
patent: 4471276 (1984-09-01), Cudlitz
patent: 4484122 (1984-11-01), Day et al.
patent: 4520296 (1985-05-01), Lepper et al.
patent: 4540944 (1985-09-01), Watanabe
patent: 5027083 (1991-06-01), Kutzavitch et al.
patent: 5170429 (1992-12-01), Stocklin et al.
patent: 5269937 (1993-12-01), Dollinger et al.
patent: 5363070 (1994-11-01), Arimoto
patent: 5642035 (1997-06-01), Ragsdale
patent: 5656926 (1997-08-01), Ragsdale
patent: 5729426 (1998-03-01), Ragsdale
patent: 5891179 (1999-04-01), Er et al.
patent: 5922282 (1999-07-01), Ledley
patent: 6356086 (2002-03-01), Cook et al.
patent: 6771082 (2004-08-01), Ragsdale et al.
patent: 6798175 (2004-09-01), Hanada et al.
patent: 6856119 (2005-02-01), Crawford
patent: 7054685 (2006-05-01), Dimmer et al.
patent: 2003/0026092 (2003-02-01), Reese et al.
patent: 2003/0214269 (2003-11-01), Shiue
patent: 2004/0171962 (2004-09-01), Leveque et al.
patent: 2005/0052630 (2005-03-01), Smith et al.
patent: 2006/0115888 (2006-06-01), Gamelin et al.
patent: 2007/0188181 (2007-08-01), Karges et al.
patent: 2007/0194759 (2007-08-01), Shimizu et al.
patent: 2008/0024079 (2008-01-01), Matsubara et al.
patent: WO 2004/050866 (2004-06-01), None
U.S. Appl. No. 11/567,373, filed Dec. 6, 2006.
U.S. Appl. No. 60/826,422, filed Sep. 21, 2006.
U.S. Appl. No. 11/857,679, filed Sep. 19, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for measuring sample resistance in electroporation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for measuring sample resistance in electroporation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for measuring sample resistance in electroporation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4073747

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.