Methods for measuring at least one physical characteristic...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S613000

Reexamination Certificate

active

08035094

ABSTRACT:
A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.

REFERENCES:
patent: 3009253 (1961-11-01), Swanson et al.
patent: 3941484 (1976-03-01), Dreyfus
patent: 4021119 (1977-05-01), Stauffer
patent: 4062633 (1977-12-01), Stapleton et al.
patent: 4576482 (1986-03-01), Pryor
patent: 4634273 (1987-01-01), Farleman et al.
patent: 4644394 (1987-02-01), Reeves
patent: 4747689 (1988-05-01), Aldred
patent: 4748332 (1988-05-01), Kuhne et al.
patent: 4753532 (1988-06-01), Aldred
patent: 4872757 (1989-10-01), Cormack et al.
patent: 5150623 (1992-09-01), Woods
patent: 5175595 (1992-12-01), Fukase
patent: 5296914 (1994-03-01), Aldred
patent: 5521707 (1996-05-01), Castore et al.
patent: 5646724 (1997-07-01), Hershline
patent: 5712706 (1998-01-01), Castore et al.
patent: 5796485 (1998-08-01), Dassler et al.
patent: 5841542 (1998-11-01), Milana et al.
patent: 5897611 (1999-04-01), Case et al.
patent: 5914784 (1999-06-01), Ausschnitt et al.
patent: 6055329 (2000-04-01), Mufti
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6111601 (2000-08-01), Adachi
patent: 6141106 (2000-10-01), Blum
patent: 6172748 (2001-01-01), Sones et al.
patent: 6404912 (2002-06-01), Lehnen et al.
patent: 6683995 (2004-01-01), Ford et al.
patent: 7777209 (2010-08-01), Johnson et al.
patent: 2002/0041381 (2002-04-01), Akishiba
patent: 2003/0101602 (2003-06-01), Galestien
patent: 2004/0036878 (2004-02-01), Johnson
patent: 2004/0150815 (2004-08-01), Sones et al.
patent: 2008/0049235 (2008-02-01), Crowther
patent: 2008/0151268 (2008-06-01), Archie et al.
patent: 2009/0101851 (2009-04-01), Spalding
Mutan, Comparison of Regression Techniques Via Monte Carlo Simulation, Jun. 2004, 33 pages.
Gabriel, Least Squares Approximation of Matrices by Additive and Multiplicative Models, Journal of Royal Statistical Society, Series B (Methodological), vol. 40 No. 2, Dec. 1978, 12 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods for measuring at least one physical characteristic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods for measuring at least one physical characteristic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods for measuring at least one physical characteristic... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4299874

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.