Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-09-16
2008-09-16
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C359S107000, C359S108000
Reexamination Certificate
active
11407600
ABSTRACT:
Various embodiments of the present invention are directed to methods for determining a phase shift acquired by an entangled N-qubit system represented by a NOON state. In one embodiment, a probe electromagnetic field is coupled with each qubit system. The phase shift acquired by the qubit systems is transferred to the probe electromagnetic field by transforming each qubit-system state into a linear superposition of qubit basis states. An intensity measurement is performed on the probe electromagnetic field in order to obtain a corresponding measurement result. A counter associated with a measurement-result interval is incremented, based on the measurement result falling within the measurement-result interval. A frequency distribution is produced by normalizing the counter associated with each measurement-result interval for a number of trials. The phase shift is determined by fitting a probability distribution associated with the probe electromagnetic field to the frequency distribution as a function of the phase shift.
REFERENCES:
patent: 7133173 (2006-11-01), Beausoleil et al.
Barrett Sean D.
Beausoleil Raymond G.
Kok Pieter
Munro William J.
Nemoto Kae
Barlow Jr. John E
Cherry Stephen J
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