Methods and tools for controlling the removal of material...

Abrading – Precision device or process - or with condition responsive... – By optical sensor

Reexamination Certificate

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C451S041000

Reexamination Certificate

active

07988529

ABSTRACT:
Methods and apparatus for controlling the removal of material from microfeature workpieces in abrasive removal processes. An embodiment of such a method comprises irradiating a periodic structure of the workpiece and obtaining an intensity distribution of radiation returning from the periodic structure. The workpiece can be irradiated with a wide spectrum of wavelengths (e.g., white light), or the workpiece can be irradiated with a laser or lamp at specific wavelengths. The intensity distribution can be an image or other signal from which a dimension or other physical parameter of the periodic structure can be determined. For example, the intensity distribution can be an intensity signal of radiation returning from the workpiece in a selected bandwidth (e.g., 200 nm-900 nm) or an image of a diffraction pattern of radiation that has been scattered by the periodic structure. The method further includes outputting a control signal based on the obtained intensity distribution. For example, the control signal can be an endpoint signal indicating the actual endpoint of the abrasive removal process.

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patent: 2002/0127950 (2002-09-01), Hirose et al.
patent: 1341223 (2003-09-01), None
Abdi, H., Partial Least Squares (PLS) Regression, in M. Lewis-Beck, A. Bryman, T. Futing (Eds):Encyclopedia for research methods for the social sciences. Thousand Oaks (CA): Sage. pp. 792-795, 2003.
Boulesteix, Anne-Laure and Korbinian Strimmer, “Partial least squares: a versatile tool for the analysis of high-dimensional genomic data,” Briefings in Bioinformatics, vol. 8, No. 1, pp. 32-44, Oxford University Press, May 26, 2006.
International Search Report and Written Opinion issued Dec. 3, 2007 in International Application No. PCT/US2007/074845.

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