Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2008-07-18
2009-08-25
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S639000, C324S642000, C340S540000, C340S691100, C250S250000, C343S823000
Reexamination Certificate
active
07579845
ABSTRACT:
The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under inspection. The object under inspection absorbs radiation in a manner dependent upon its metal content. The microwave radiation absorption can be used to generate a measurement of metal content. The measurement, in turn, can be used to calculate at least a portion of the volume and shape of the object under inspection. The measurement can be compared to a plurality of predefined threats. The microwave screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray transmission based screening, X-ray scattered based screening, or Computed Tomography based screening.
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Mann Kenneth Robert
Peschmann Kristian R.
Nguyen Vincent Q
PatentMetrix
Rapiscan Security Products, Inc.
Zhu John
LandOfFree
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