Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-03-08
2011-03-08
Natalini, Jeff (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S686000, C324S688000
Reexamination Certificate
active
07902842
ABSTRACT:
Methods, systems and devices are described for detecting a measurable capacitance using charge transfer techniques that can be implemented with many standard microcontrollers, and can share components to reduce device complexity and improve performance. In the various implementations of this embodiment, the passive network used to accumulate charge can be shared between multiple measurable capacitances. Likewise, in various implementations a voltage conditioning circuit configured to provide a variable reference voltage can be shared between multiple measurable capacitances. Finally, in various implementations a guarding electrode configured to guard the measurable capacitances can be shared between multiple measurable capacitances. In each of these cases, sharing components can reduce device complexity and improve performance.
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Ely David
Haines Julian
Hargreaves Kirk
Reynolds Joseph Kurth
Routley Paul
Ingrassia Fisher & Lorenz P.C.
Natalini Jeff
Synaptics Incorporated
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