Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2007-01-19
2009-02-24
Jackson, Stephen W (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S091100
Reexamination Certificate
active
07495874
ABSTRACT:
Protection methods and protection systems for semiconductor devices with diode junctions. The protection methods and protection systems detect the anomalies in the behavior of the junction and protect the device from damage.
REFERENCES:
patent: 3997849 (1976-12-01), Thommen
patent: 4415815 (1983-11-01), Dijkmans et al.
patent: 5287367 (1994-02-01), Yanagawa
patent: 5604758 (1997-02-01), AuYeung et al.
patent: 5654560 (1997-08-01), Nishizawa et al.
patent: 5812580 (1998-09-01), Nabiev et al.
patent: 5818857 (1998-10-01), Palmer
patent: 5966394 (1999-10-01), Spurr et al.
patent: 6229833 (2001-05-01), Noda et al.
patent: 2002/0190666 (2002-12-01), Sakamoto et al.
patent: 2003/0039280 (2003-02-01), Mangano et al.
patent: 2003/0048820 (2003-03-01), Fischer
patent: 2003/0058906 (2003-03-01), Finn et al.
patent: 2003/0091077 (2003-05-01), Fischer
patent: 2003/0152390 (2003-08-01), Stewart et al.
G. Beister et al. Method for Observation of Facet Degradation and Stabilization in InGaAs-QW/GaAs//AlGaAs Laser Diodes, available at http://www.fbh-berlin.de/jb—96/jb52.pdf, pp. 99-101.
U.S. Appl. No. 60/544,646, entitled Methods and Systems for High Current Semiconductor Diode Junction Fault Protection, filed Feb. 13, 2004.
Burns & Levinson LLP
Cohen Jerry
Jackson Stephen W
Lopez Orlando
Science Research Laboratory, Inc.
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