Methods and systems for protection from over-stress

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C374S102000, C374S107000, C374S178000, C361S103000

Reexamination Certificate

active

07607828

ABSTRACT:
One embodiment of the invention relates to a circuit for over-stress protection. The circuit includes a temperature rate sensor configured to monitor the temperature of a semiconductor device during a first state. The circuit is further configured to selectively switch the semiconductor device from the first state to a second state if the temperature increases at a rate that has a predetermined relationship with a temperature rate function. Other methods and systems are also disclosed.

REFERENCES:
patent: 4903106 (1990-02-01), Fukunaga et al.
patent: 5497285 (1996-03-01), Nadd
patent: 5555152 (1996-09-01), Brauchle et al.
patent: 6807507 (2004-10-01), Kumar et al.
patent: 6819091 (2004-11-01), Ishihara et al.
patent: 2005/0231146 (2005-10-01), De Frutos et al.
patent: 2007/0103833 (2007-05-01), Harris
Infineon Technologies, “Addendum for PCN 2004-018-A, BTS 5240 G”, Aug. 2004, 18 pgs.
Siemens, Semiconductor Group, PROFET® Functional Description & Application Notes, Mar. 4, 1997, 10 pgs.
Siemens, Semiconductor Group, PROFET-Description, Mar. 4, 1997, 10 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and systems for protection from over-stress does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and systems for protection from over-stress, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and systems for protection from over-stress will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4137914

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.