Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-07
2005-06-07
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
06904374
ABSTRACT:
Methods and systems for predicting electromagnetic scattering are disclosed. In one embodiment, a method includes covering at least a portion of an analytical model of a target with computational cells, and formulating a plurality of approximation functions. The formulating of the approximation functions includes simplifying a set of method of moments equations based on Kirchhoff's first law to provide an impedance matrix multiplied by a solution vector equated with a right hand side vector. A plurality of boundary conditions are established for the plurality of approximation functions, and the plurality of approximation functions are solved for the solution vector. The impedance matrix is deflated by a sparse transformation determined by the geometry of the scatterer, independent of material properties and frequency, subsequently reducing the computational complexity of the scattering calculation.
REFERENCES:
patent: 6353801 (2002-03-01), Sercu et al.
patent: 2003/0167156 (2003-09-01), Alba
Black Lowe & Graham PLLC
Nghiem Michael
The Boeing Company
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