Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate
2006-04-11
2006-04-11
Rosenberger, Richard A. (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
C356S121000, C219S121780
Reexamination Certificate
active
07027155
ABSTRACT:
A method and system for locally processing a predetermined microstructure formed on a substrate without causing undesirable changes in electrical or physical characteristics of the substrate or other structures formed on the substrate are provided. The method includes providing information based on a model of laser pulse interactions with the predetermined microstructure, the substrate and the other structures. At least one characteristic of at least one pulse is determined based on the information. A pulsed laser beam is generated including the at least one pulse. The method further includes irradiating the at least one pulse having the at least one determined characteristic into a spot on the predetermined microstructure. The at least one determined characteristic and other characteristics of the at least one pulse are sufficient to locally process the predetermined microstructure without causing the undesirable changes.
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