Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate
2011-08-09
2011-08-09
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Logic design processing
C716S111000
Reexamination Certificate
active
07996801
ABSTRACT:
Methods and systems for on-the-fly chip verification method for tracking non-contiguous events. A method includes comparing a first search marker associated with a first check vector to a search key associated with an output vector of a design under test (DUT). The method also includes performing either: verifying a validity of the output vector when the first search marker equals the search key, or comparing a second search marker associated with a second check vector to the search key when the first search marker does not equal the search key.
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Bluestone Randall
International Business Machines - Corporation
Lin Sun J
Roberts Mlotkowski Safran & Cole P.C.
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