Methods and systems for mass defect filtering of mass...

Details Methods and systems for mass defect filtering of mass... Methods and systems for mass defect filtering of mass...

2006-06-23

2009-12-15

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Chemical analysis

C702S179000, C702S180000, C702S190000

Reexamination Certificate

active

07634364

ABSTRACT:
The present teachings relate to a method of filtering mass spectrometer data using a variable filter window. The width of the window can depend on the mass itself and the mass defects for a family of compounds. The teachings can be used with a plurality of compounds including but not limited to peptides and can be utilized on a brood range of mass spectrometers.

REFERENCES:
patent: 2007/0278395 (2007-12-01), Gorenstein et al.

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