Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2007-07-26
2009-11-17
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C356S237200, C250S208100, C250S2140VT, C250S370110
Reexamination Certificate
active
07619728
ABSTRACT:
Methods and systems for inspecting rotatable machine components are provided. The system includes a fiber optic port configured to extend through a first aperture of a machine casing wherein the port includes an interior end and an exterior end. The system further includes an imager configured to optically couple to the exterior end. The imager includes a light intensifier capable of generate images of inspection components though the port using ambient light. The imager further includes an image capture gate configured to control an acquisition time of the generated images.
REFERENCES:
patent: 4180329 (1979-12-01), Hildebrand
patent: 4326804 (1982-04-01), Mossey
patent: 4447123 (1984-05-01), Page et al.
patent: 4572663 (1986-02-01), Greene et al.
patent: 4688891 (1987-08-01), Carratt et al.
patent: 4711524 (1987-12-01), Morey et al.
patent: 5095252 (1992-03-01), Kurth
patent: 5177779 (1993-01-01), Cornu et al.
patent: 5308986 (1994-05-01), Walker
patent: 5418608 (1995-05-01), Caimi et al.
patent: 5733246 (1998-03-01), Forkey
patent: 5815264 (1998-09-01), Reed et al.
patent: 5986752 (1999-11-01), Morito et al.
patent: 6448545 (2002-09-01), Chen
patent: 6796709 (2004-09-01), Choi
patent: 6992315 (2006-01-01), Twerdochlib
patent: 2006/0038988 (2006-02-01), Thermos
patent: 2006/0078193 (2006-04-01), Brummel et al.
patent: 2006/0088793 (2006-04-01), Brummel et al.
A European Search Report, dated Nov. 3, 2008, for corresponding European patent application No. EP 08-16-0935.
Gilchrist, III George Martin
Ogburn Erik Matthew
Armstrong Teasdale LLP
General Electric Company
Nguyen Sang
LandOfFree
Methods and systems for in-situ machinery inspection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and systems for in-situ machinery inspection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and systems for in-situ machinery inspection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4102585