Methods and systems for handling a workpiece in vacuum-based...

Drying and gas or vapor contact with solids – Process – Gas or vapor contact with treated material

Reexamination Certificate

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C034S403000

Reexamination Certificate

active

10985727

ABSTRACT:
Methods and systems are provided for handling an item in a vacuum-based handling system for semiconductor manufacturing. The methods include providing a heater or dryer for the load lock of the handling system that dries a semiconductor wafer during the pumping down of the load lock.

REFERENCES:
patent: 3294670 (1966-12-01), Charschan et al.
patent: 3584847 (1971-06-01), Hammond et al.
patent: 4015558 (1977-04-01), Small et al.
patent: 4184448 (1980-01-01), Aichert et al.
patent: 4275978 (1981-06-01), Brooks et al.
patent: 4318767 (1982-03-01), Hijikata
patent: 4398720 (1983-08-01), Jones et al.
patent: 4529460 (1985-07-01), Hasegawa et al.
patent: 4666366 (1987-05-01), Davis
patent: 4712971 (1987-12-01), Fyler
patent: 4730976 (1988-03-01), Davis et al.
patent: 4749465 (1988-06-01), Flint et al.
patent: 4825808 (1989-05-01), Takahashi et al.
patent: 4909701 (1990-03-01), Hardegen et al.
patent: 4917556 (1990-04-01), Stark et al.
patent: 4951601 (1990-08-01), Maydan et al.
patent: 5076205 (1991-12-01), Vowles et al.
patent: 5180275 (1993-01-01), Czech et al.
patent: 5227708 (1993-07-01), Lowrance
patent: 5234303 (1993-08-01), Koyano
patent: 5259881 (1993-11-01), Edwards et al.
patent: 5314541 (1994-05-01), Saito et al.
patent: 5333986 (1994-08-01), Mizukami et al.
patent: 5377425 (1995-01-01), Kawakami et al.
patent: 5426865 (1995-06-01), Ikeda et al.
patent: 5431529 (1995-07-01), Eastman et al.
patent: 5433020 (1995-07-01), Leech, Jr.
patent: 5447409 (1995-09-01), Grunes et al.
patent: 5447431 (1995-09-01), Muka
patent: 5571325 (1996-11-01), Ueyama et al.
patent: 5657553 (1997-08-01), Tarui et al.
patent: 5700127 (1997-12-01), Harada et al.
patent: 5765983 (1998-06-01), Caveney et al.
patent: 5810549 (1998-09-01), Wytman
patent: 5897710 (1999-04-01), Sato
patent: 6017820 (2000-01-01), Ting et al.
patent: 6048162 (2000-04-01), Moslehi
patent: 6126381 (2000-10-01), Bacchi
patent: 6235634 (2001-05-01), White et al.
patent: 6253464 (2001-07-01), Klebanoff et al.
patent: 6267549 (2001-07-01), Brown et al.
patent: 6286230 (2001-09-01), White et al.
patent: 6318951 (2001-11-01), Schmidt et al.
patent: 6375746 (2002-04-01), Stevens et al.
patent: 6400115 (2002-06-01), Yamazoe
patent: 6440178 (2002-08-01), Berner et al.
patent: 6514032 (2003-02-01), Saino et al.
patent: 6669434 (2003-12-01), Namba et al.
patent: 6758113 (2004-07-01), Choy et al.
patent: 6840732 (2005-01-01), Minami
patent: 6889447 (2005-05-01), Lee et al.
patent: 6949143 (2005-09-01), Kurita et al.
patent: 6960057 (2005-11-01), Hofmeister
patent: 2002/0094265 (2002-07-01), Momoki
patent: 2004/0151562 (2004-08-01), Hofmeister et al.
patent: 2005/0223837 (2005-10-01), Van Der Meulen
“PCT Notification of Transmittal of the International Search Report or the Declaration, PCT/US04/37672”,International Searching Authority, (Dec. 19, 2005).

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