Methods and systems for determining the z-axis profile of a dete

Details Methods and systems for determining the z-axis profile of a dete Methods and systems for determining the z-axis profile of a dete

1996-02-06

1997-03-11

Wong, Don

X-ray or gamma ray systems or devices

Specific application

Computerized tomography

378151, 378 4, G21K 510

Patent

active

056109636

ABSTRACT:
Apparatus and methods for generating z-axis profiles for a CT system detector are described. In one form, the method includes the steps of directing x-ray beams having different z-axis centroids and slice thicknesses at the detector and collecting detector signals for each beam. The detector signal for a first beam is then subtracted from the detector signal for a second beam to obtain a differential, or composite, detector signal which corresponds to a third beam having yet another z-axis centroid and slice thickness. The full z-axis profile of the detector is generated from measured detector signals and composite detector signals.

REFERENCES:
patent: 4812983 (1989-03-01), Gullberg et al.
patent: 5054041 (1991-10-01), Hampel
patent: 5131021 (1992-07-01), Gard et al.
patent: 5299250 (1994-03-01), Styrnol et al.

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