Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2008-09-30
2010-10-12
Kundu, Sujoy K (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
C702S104000, C702S105000, C702S127000, C702S151000, C702S152000, C702S153000, C702S155000, C702S158000, C250S208100, C250S239000, C250S566000, C356S305000, C356S326000, C356S328000
Reexamination Certificate
active
07813891
ABSTRACT:
This application generally relates to methods and systems for detecting spectrophotometer misalignment. In particular, the application may characterize the noise of a spectral measurement relative to a reference substrate known to exhibit a generally linear (flat) spectral output over a known spectrum. From the spectral measurement, a linear regression may be performed on a portion of the spectral output to determine a best fit line and a correlation of determination (“R-squared value”) may be determined correlated the measured data to the best fit line. Finally, the R squared value may be compared to a predetermined threshold R squared value to determine if the sensor is misaligned beyond an acceptable amount. If so, an alert may be generated.
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None, “Correlation Coefficient,” from Internet, http://mathbits.com/ Mathits/TISection/Statistics2, correlation.htm, accessed Aug. 1, 2008, 3 pp.
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Bonino Paul S.
Sulenski Timothy J.
Kundu Sujoy K
Pillsbury Winthrop Shaw & Pittman LLP
Xerox Corporation
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