Methods and systems for automatically characterizing...

Dynamic magnetic information storage or retrieval – General processing of a digital signal

Reexamination Certificate

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C360S031000, C360S053000

Reexamination Certificate

active

07460323

ABSTRACT:
A method for automatically characterizing non-linearities of a perpendicular read-back signal of a recording system is disclosed. The method includes using dibit extraction to obtain a read-back signal having a main pulse and a plurality of echoes where the read-back signal exhibits a baseline shift. An area under the first echo is integrated to obtain a first area where the integrating subtracts any baseline shift area within the first echo and where the first echo is associated with a first non-linearity. The method integrates an area of the read-back signal under the main pulse to obtain a second area where the integrating subtracts any baseline shift area within the main pulse. A first parameter is computed that characterizes the first non-linearity based on the first area and the second area. The method may be applied to characterize several non-linearities.

REFERENCES:
patent: 5262904 (1993-11-01), Tang et al.
patent: 5493454 (1996-02-01), Ziperovich et al.
patent: 6208477 (2001-03-01), Cloke et al.
patent: 6636372 (2003-10-01), Nguyen et al.
patent: 6741412 (2004-05-01), Sawaguchi et al.
patent: 7170704 (2007-01-01), DeGroat et al.
patent: 2004/0190172 (2004-09-01), Sawaguchi et al.
patent: 2007/0047120 (2007-03-01), DeGroat
Palmer et al, Identification of Nonlinear Write Effects Using Pseudorandom Sequences, Sep. 1987, IEEE Transactions on Magnetics, vol. Mag-23, No. 5, pp. 2377-2379.
Ozgunes et al, Synchronization-Free Dibit Response Extraction from PRBS Waveforms, Sep. 2003, IEEE Transactions on Magnetics, vol. 39, No. 5, pp. 2225-2227.

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