Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-05-30
2006-05-30
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S181000, C702S183000, C702S189000
Reexamination Certificate
active
07054785
ABSTRACT:
Methods and systems for analyzing flutter test data using non-linear transfer function frequency response fitting are provided. In one embodiment, a plurality of data points are read, with each data point representing a motion of an aeroelastic structure (e.g. an aircraft surface) at a different location. A closed form fit to the plurality of data points is performed to obtain an initial curve fit condition. At least one non-linear transfer function frequency response curve fit is then performed to the plurality of data points.
REFERENCES:
patent: 5444641 (1995-08-01), White
patent: 5475793 (1995-12-01), Broomhead et al.
patent: 5640330 (1997-06-01), Cooper et al.
patent: 5819188 (1998-10-01), Vos
patent: 6216063 (2001-04-01), Lind et al.
patent: 6246929 (2001-06-01), Kaloust
patent: 6253120 (2001-06-01), Shimada et al.
patent: 6268824 (2001-07-01), Zhodzishky et al.
patent: 2004/0009063 (2004-01-01), Polacsek
patent: 2004/0202049 (2004-10-01), Breed et al.
Hoff Marc S.
Lee & Hayes PLLC
Suarez Felix
The Boeing Company
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