Methods and systems for adaptive dither pattern processing

Computer graphics processing and selective visual display system – Computer graphics processing – Attributes

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C345S598000, C345S599000

Reexamination Certificate

active

07554555

ABSTRACT:
Embodiments of the present invention comprise methods and systems for adaptive dither pattern array generation and application.

REFERENCES:
patent: 4460924 (1984-07-01), Lippel
patent: 4568966 (1986-02-01), Lippel
patent: 4652905 (1987-03-01), Lippel
patent: 4675532 (1987-06-01), Carson
patent: 4758893 (1988-07-01), Lippel
patent: 4965668 (1990-10-01), Abt et al.
patent: 5148273 (1992-09-01), Lippel
patent: 5253045 (1993-10-01), Lippel
patent: 5254982 (1993-10-01), Feigenblatt et al.
patent: 5619228 (1997-04-01), Doherty
patent: 5619230 (1997-04-01), Edgar
patent: 5623281 (1997-04-01), Markandey et al.
patent: 5652624 (1997-07-01), Lippel
patent: 5712657 (1998-01-01), Eglit et al.
patent: 5714974 (1998-02-01), Liu
patent: 5726718 (1998-03-01), Doherty et al.
patent: 5751379 (1998-05-01), Markandy et al.
patent: 5909516 (1999-06-01), Lubin
patent: 5969710 (1999-10-01), Doherty et al.
patent: 6040876 (2000-03-01), Pettitt et al.
patent: 6052491 (2000-04-01), Clatanoff et al.
patent: 6084560 (2000-07-01), Miyamoto
patent: 6094187 (2000-07-01), Jones et al.
patent: 6108122 (2000-08-01), Ulrich et al.
patent: 6147671 (2000-11-01), Agarwal
patent: 6147792 (2000-11-01), Jones et al.
patent: 6215913 (2001-04-01), Clatanoff et al.
patent: 6281942 (2001-08-01), Wang
patent: 6476824 (2002-11-01), Suzuki et al.
patent: 6507018 (2003-01-01), Young
patent: 0656616 (1995-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Methods and systems for adaptive dither pattern processing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and systems for adaptive dither pattern processing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and systems for adaptive dither pattern processing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4135427

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.