X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2011-03-08
2011-03-08
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S071000, C378S086000
Reexamination Certificate
active
07901136
ABSTRACT:
A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.
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Armstrong Teasdale LLP
Glick Edward J
Midkiff Anastasia
Morpho Detection Inc.
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