Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Reexamination Certificate
2007-04-10
2007-04-10
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
C324S076540, C324S076820
Reexamination Certificate
active
11061292
ABSTRACT:
Methods and structure for improved high-speed TDF testing using an on-chip PLL and associated logic to generate high speed launch and capture pulses. A reference clock may be applied to a PLL circuit within the integrated circuit under test to generate a higher frequency PLL Clock. Gating Logic features and aspects within the integrated circuit may apply the PLL Clock signal to a TDF Clock signal when so directed by a TDF Enable signal from an external test system. The PLL Clock is applied to the TDF Clock signal path for precisely two clock pulses for use as a launch and capture pulse sequence for TDF testing at higher speeds than the external automated test system may achieve.
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Feist Douglas
Gearhardt Kevin
Duft Bernsen & Fishman, LLP
He Amy
LSI Logic Corporation
Nguyen Vincent Q.
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