Methods and means for full-surface interferometric testing of gr

Details Methods and means for full-surface interferometric testing of gr Methods and means for full-surface interferometric testing of gr

1989-06-22

1991-05-28

Turner, Samuel

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356351, 356356, 356360, G01B 902

Patent

active

050188615

ABSTRACT:
The disclosed method and means measure the characteristics of an optical device by directing light waves by normal-incidence sub-aperture interferometry on the optical device, shear-polarizing the light directed onto the optical device, and analyzing the results of the interference to obtain the characteristics of the optical device.

REFERENCES:
patent: 3849003 (1974-11-01), Velzel
patent: 4844616 (1989-07-01), Kulkarni et al.

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