Methods and devices for measuring fundamental data of lenses

Details Methods and devices for measuring fundamental data of lenses Methods and devices for measuring fundamental data of lenses

2007-10-23

2007-10-23

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Lens or reflective image former testing

Reexamination Certificate

active

10824356

ABSTRACT:
A measurement device may illuminate lens10to be inspected with light at a plurality of different angles of incidence. The transmitted light that passes through lens10may be preferably detected by light detecting means36. When light detecting means36detects the light, it outputs an electrical signal. Control unit54may (1) align light source22in the predetermined position and turns it on and (2) calculate the degree of refraction of the transmitted light that passes through lens10, based upon the electrical signal output from light detecting means36. Then, control unit54may further (3) conduct illumination at a plurality of different angles of incidence and obtain a plurality of “angle of incidence—degree of refraction” relationships from the degree of refraction calculated for each angle of incidence, and (4) calculate the fundamental data of lens10by using the plurality of “angle of incidence—degree of refraction” relationships.

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Kuppuswamy Venkatesan Sriram et al., “Talbot Interferometry in Noncollimated Illumination for Curvature and Focal Length Measurements” Applied Optics, OSA, Optical Society of America, Washington, DC, vol. 31, No. 1, Jan. 1, 1992, pp. 75-79.

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