Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2005-01-04
2005-01-04
Lee, John R. (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S282000
Reexamination Certificate
active
06838663
ABSTRACT:
The subject invention pertains to a methods and devices for ionizing a sample material. The subject invention also relates to an ionization source and to a method of sampling gas-phase ions from a sample. An ionization source in accordance with the subject invention can be used in conjunction with mass spectrometry or other sampling techniques. The subject invention can utilize a means for desorbing gas-phase ions and neutral molecules from a sample and a means to generate reagent ions where the reagent ions ionize the desorbed neutral molecules so as to increase the population of gas-phase ions. The subject invention can incorporate laser radiation for desorbing gas-phase ions and neutral molecules from a sample. In a specific embodiment, the subject invention provides an ionization source that uses a pulsed laser for desorption, so as to produce a population of desorbed neutral molecules from a sample, as well as a number of gas-phase sample ions. In a further specific embodiment, the pulsed laser radiation can be adjusted such that neutral molecules are desorbed without the production of gas-phase sample ions by the laser radiation.
REFERENCES:
patent: 4771172 (1988-09-01), Weber-Grabau et al.
patent: 4988879 (1991-01-01), Zare et al.
patent: 5663561 (1997-09-01), Franzen et al.
patent: 5955731 (1999-09-01), Bergmann et al.
patent: 5965884 (1999-10-01), Laiko et al.
patent: 6104028 (2000-08-01), Hunter et al.
patent: 6281493 (2001-08-01), Vestal et al.
patent: 6288390 (2001-09-01), Siuzdak et al.
patent: 20030111600 (2003-06-01), Thompson et al.
patent: 11064283 (1999-03-01), None
Bruins, A.P. “Mass Spectrometry with Ion Sources Operating at Atmospheric Pressure”Mass Spectrometry Reviews, 1991, pp. 53-77, vol. 10.
Dzidic, I. et al. “Atmospheric Pressure Ionization (API) Mass Spectrometry; Formation of Phenoxide Ions from Chlorinated Aromatic Compounds”Analytical Chemistry,Jul. 1975, pp. 1308-1312, vol. 47, No. 8.
Escandon, N.A. et al. “Characterization of the Serotonin1AReceptor Antagonist Activity of WAY-100135 and Spiperone”The Journal of Pharmacology and Experimental Therapeutics,1994, pp. 441-447, vol. 268, No. 1.
Harrison, A.G.,Chemical Ionization Mass Spectrometry 2ndEdition,1992, CRC Press, Inc., U.S.A.
Sunner, J. et al. “Sensitivity Enhancements Obtained at High Temperatures in Atmospheric Pressure Ionization Mass Spectrometry”Analytical Chemistry,1988, pp. 1308-1313, vol. 60, No. 13.
Sunner, J. et al. “Factors Determining Relative Sensitivity of Analytes in Positive Mode Atmospheric Pressure Ionization Mass Spectrometry”Analytical Chemistry,1988, pp. 1300-1307, vol. 60, No. 13.
Coon, J.J. et al., “Atmospheric Pressure Laser Desorption/Chemical Ionization Mass Spectrometry: A New Ionization Method Based on Existing Therms”Rapid Commnuications in Mass Spectrometry,2002, pp. 681-685, vol. 16.
Coon, J.J. et al. poster materials “The Development of a Novel Atmospheric Pressure-Laser Desorption/Chemical Ionization (AP-LD/CI) Interface for Imaging Mass Spectrometry”17thAsilomar Conference on Mass Spectrometry,2001.
Laiko, V.V. et al. “Atmospheric Pressure Matrix-Assisted Laser Desorption/Ionization Mass Spectrometry”Anal. Chem.,2000, pp. 652-657, vol. 72.
Coon Joshua J.
Harrison Willard W.
Lee John R.
Saliwanchik Lloyd & Saliwanchik
Smith II Johnnie L
University of Florida
LandOfFree
Methods and devices for laser desorption chemical ionization does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and devices for laser desorption chemical ionization, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and devices for laser desorption chemical ionization will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3425648