Measuring and testing – Vibration – Resonance – frequency – or amplitude study
Reexamination Certificate
2006-11-14
2006-11-14
Williams, Hezron (Department: 2856)
Measuring and testing
Vibration
Resonance, frequency, or amplitude study
C073S597000, C073S602000, C600S437000
Reexamination Certificate
active
07134341
ABSTRACT:
Methods and systems for determining the resonance frequency of a resonator, using the Doppler effect. An interrogating sonic beam including a carrier frequency and one or more resonator exciting frequencies is directed at a resonator disposed in a measurement environment. Resonator vibrations are excited by the resonator exciting frequencies. The carrier frequency is modulated by the vibrating part(s) of the resonator. The returning signal is received and analyzed to determine the amplitude of the Doppler shifted sideband frequencies. The resulting data is processed to determine the resonator's resonance frequency. Using calibrated resonating sensors having a resonance frequency that varies as a function of a physical parameter in a measurement environment, the method and systems allow determining the value of the physical variable from the sensor's resonance frequency. The methods and systems may be used, inter alia, to determine intraluminal blood pressure in various parts of a cardiovascular system, the pressure of intra-cranial fluids, the pressure of fluids in various bodily cavities by using implantable calibratable resonating pressure sensors. The methods and systems may also be used for determining the pressure in various industrial measurement environments and enclosures. Methods and systems are provided for detecting the sensor and for centering the interrogating beam on the sensor.
REFERENCES:
patent: 4237454 (1980-12-01), Meyer
patent: 4733561 (1988-03-01), Gilby
patent: 4884450 (1989-12-01), Greenwood et al.
patent: 5260762 (1993-11-01), Telle
patent: 5524636 (1996-06-01), Sarvazyan et al.
patent: 5619997 (1997-04-01), Kaplan
patent: 5749364 (1998-05-01), Sliwa, Jr. et al.
patent: 5786735 (1998-07-01), Su
patent: 5989190 (1999-11-01), Kaplan
patent: 5997477 (1999-12-01), Sehgal
patent: 6083165 (2000-07-01), Kaplan
patent: 6301968 (2001-10-01), Maruyama et al.
patent: 6305226 (2001-10-01), Barber et al.
patent: 6312380 (2001-11-01), Hoek et al.
patent: 6331163 (2001-12-01), Kaplan
patent: 6461301 (2002-10-01), Smith
patent: 6470753 (2002-10-01), Maruyama
patent: 6671638 (2003-12-01), Kitazumi et al.
patent: 6770032 (2004-08-01), Kaplan
patent: 6787051 (2004-09-01), Silverbrook
patent: 6970742 (2005-11-01), Mann et al.
patent: 2005/0148205 (2005-07-01), Franosch et al.
patent: 2005/0288590 (2005-12-01), Kaplan
U.S. Appl. No. 10/876,781, filed Jun. 28, 2004, Kaplan.
U.S. Appl. No. 10/876,763, filed Jun. 28, 2004, Kaplan.
U.S. Appl. No. 09/004,420, filed Jan. 8, 1998, Richter et al.
Avraham Nissim
Eisenberg Ran
Girmonsky Doron
AlphaPatent Associates Ltd.
Saint-Surin Jacques
Swirsky Daniel J.
Williams Hezron
Zuli Holdings Ltd
LandOfFree
Methods and devices for determining the resonance frequency... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and devices for determining the resonance frequency..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and devices for determining the resonance frequency... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3705819