Methods and devices for charge management for...

Details Methods and devices for charge management for... Methods and devices for charge management for...

2005-06-14

2005-06-14

Gregory, Bernarr E. (Department: 3662)

Optics: measuring and testing

Angle measuring or angular axial alignment

Apex of angle at observing or detecting station

C348S302000, C348S313000

Reexamination Certificate

active

06906793

ABSTRACT:
Structures and methods for three-dimensional image sensing using high frequency modulation includes CMOS-implementable sensor structures using differential charge transfer, including such sensors enabling rapid horizontal and slower vertical dimension local charge collection. Wavelength response of such sensors can be altered dynamically by varying gate potentials. Methods for producing such sensor structures on conventional CMOS fabrication facilities include use of “rich” instructions to command the fabrication process to optimize image sensor rather than digital or analog ICs. One detector structure has closely spaced-apart, elongated finger-like structures that rapidly collect charge in the spaced-apart direction and then move collected charge less rapidly in the elongated direction. Detector response is substantially independent of the collection rate in the elongated direction.

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