Methods and devices for analyzing crystalline content of...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth with a subsequent step acting on the...

Reexamination Certificate

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C117S003000, C378S073000

Reexamination Certificate

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07144457

ABSTRACT:
Systems and methods are provided for evaluating a crystallization experiment, where a crystallization experiment of a molecule is to X-rays while housed within a container in which the crystallization experiment is performed; and one or more X-ray diffraction patterns from the X-ray exposure are used to evaluate whether crystalline material is present in the crystallization experiment.

REFERENCES:
patent: 6836532 (2004-12-01), Durst et al.
patent: 2003/0159641 (2003-08-01), Sanjoh et al.
patent: 2004/0013231 (2004-01-01), He et al.
patent: 2004/0215398 (2004-10-01), Mixon et al.
patent: 2004/0258203 (2004-12-01), Yamano et al.
patent: WO 03/032558 (1999-01-01), None

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