Methods and devices for aligning and determining the...

Details Methods and devices for aligning and determining the... Methods and devices for aligning and determining the...

2005-08-30

2005-08-30

Bruce, David V. (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Alignment

C378S206000, C378S207000

Reexamination Certificate

active

06935778

ABSTRACT:
Methods and devices for aligning an x-ray optic with a source of x-rays and methods and devices for determining a focusing characteristic of an x-ray optic are provided. The methods and devices simplify the process of aligning an x-ray optic device (for example, a polycapillary x-ray optic) to an x-ray source or for measuring a focusing characteristic, for example, the focal length or beam shape, of an x-ray optic. In one aspect, the device includes a housing having a first aperture adapted for receiving an x-ray optic and a surface having an x-ray flourescent material from which visual fluorescence occurs when impinged by x-rays. The size and shape of fluorescence from the surface may be varied by moving the surface to determine, for example, the focal length of the x-ray optic.

REFERENCES:
patent: 6504901 (2003-01-01), Loxley et al.

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