Methods and computer program products for full N-port vector...

Details Methods and computer program products for full N-port vector... Methods and computer program products for full N-port vector...

2005-04-19

2005-04-19

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

C324S073100, C702S085000, C702S106000

Reexamination Certificate

active

06882160

ABSTRACT:
Techniques are provided for performing full N-port calibrations in an environment in which a test set is used to connect an N-port DUT to an M-port VNA, where N>M. Techniques for incorporating port impedances as part of a calibration sequence are provided. Also provided are techniques for using sequential characterization and de-embedding to generate virtual calibrations that are then used in a renormalization process.

REFERENCES:
patent: 5578932 (1996-11-01), Adamian
patent: 6300775 (2001-10-01), Peach et al.
Arbitrary Impedance, Anritsu Application Note 11410-00284, May 2002, pp. 1-11.
Marks, R.B., and Williams, D.F., “Characteristic Impedance Determination Using Propagation Constant Measurement,” IEEE Microwave and Guided Wave Letters, vol. 1, No. 6, Jun. 1991, pp. 141-143.
Tippet, J.C., “A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. MTT-30, No. 5, May 1982, pp. 661-666.
Williams, D.F., and Walker, D.K., “In-Line Multiport Calibration,” 51stARFTG Digest, Jun. 1998, pp. 88-90.

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