Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-08-14
2007-08-14
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C219S209000
Reexamination Certificate
active
11004306
ABSTRACT:
Disclosed is a DC thermal energy generator for heating localized regions of an integrated circuit. The integrated circuit includes a pair of static circuits whose outputs are shorted, and are in contention. Contention causes current to flow through the circuits, generating heat. Integrated-circuit temperature can be varied by turning on more or fewer thermal energy generators. The thermal resistance of a packaged integrated circuit is computed using a well-known relationship among the integrated circuit's measured temperature, power consumption, and the ambient temperature.
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patent: 6390379 (2002-05-01), Huang
U.S. Appl. No. 10/300,203, filed Nov. 19, 2002, Chan et al.
Xilinx, Inc., Virtex-II 1.5V Field-Programmable Gate Arrays, Nov. 29, 2001, pp. 1-39, DS031-2 (v1.9), Xilinx, Inc. 2100 Logic Drive, San Jose, CA., 95124.
Chan Siuki
Hsieh Steven H. C.
Barlow John
Cherry Stephen J.
King John J.
Xilinx , Inc.
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