Methods and apparatuses for the exact determination of an...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C250S231160, C033S0010PT, C341S013000

Reexamination Certificate

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11216217

ABSTRACT:
In a method according to the invention for the accurate determination of an angle of rotation (w) about an axis (a), at least a part of a plurality of pattern elements (5, ..., 13) arranged around a pattern center (4), a multiplicity of which are arranged one behind the other in a rotation, is at least partly focused by optical beams on a multiplicity of detector elements (2) of an optical detector (1) which are arranged in series. The pattern elements (5, ..., 13) are arranged on a rotating body (3) which is connected to the detector (1) so as to be rotatable about the axis (a). Positions (p) of the focused pattern elements are resolved by the detector elements (2) of one and the same detector (1). In a first step, effects of an eccentricity (e) of the pattern center (4) relative to the axis (a) on the determination of an angle of rotation are computationally determined from resolved positions (p) of at least one pattern element (5, ..., 13). In a second step, the angle of rotation (w) is accurately determined from the resolved positions (p1, p2, p3) of pattern elements (5, 6, 7) arranged one behind the other taking into account the effects determined.

REFERENCES:
patent: 4547667 (1985-10-01), Sasaki et al.
patent: 5214426 (1993-05-01), Minohara et al.
patent: 6958468 (2005-10-01), Kataoka
patent: 1811961 (1970-06-01), None
patent: 60031011 (1985-02-01), None
patent: 13170010 (1991-07-01), None

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