Methods and apparatuses for improved positioning in a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

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07852097

ABSTRACT:
An improved method and apparatus for automatically and accurately aligning a wafer prober to the bonding pads of a semiconductor device are provided. In one embodiment of one aspect of the invention, a multi-loop feedback control system incorporating information from a number of sensors is used to maintain the desired contact position in the presence of disturbances. Other aspects and other embodiments are also described.

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PCT Notification Concerning Transmittal of International Preliminary Report on Patentability (Chapter 1 of the Patent Cooperation Treaty), International Application No. PCT/US2006/042478 mailed Jul. 31, 2008, total 10 pages.
PCT Notification of Transmittal of International Search Report and Written Opinion of the International Searching Authority, or the Declaration, mailed May 31, 2007, total 14 pages.

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