Methods and apparatus to test electronic devices

Details Methods and apparatus to test electronic devices Methods and apparatus to test electronic devices

2008-12-29

2010-11-30

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

07843207

ABSTRACT:
Methods and apparatus to test electronic devices are disclosed. An example method includes setting a first controlled switch to prevent a current detect signal from tripping an overcurrent protection event controlling an operation of the device; setting a second controlled switch to route a first sensed voltage associated with the device to a voltage adjuster; sending a calibration current corresponding to a target threshold current through the device; detecting the first sensed voltage while the calibration current flows through the device; and setting a reference signal substantially equal to the first sensed voltage, wherein the reference signal is to be used to generate the current detect signal.

REFERENCES:
patent: 7446549 (2008-11-01), Tomita et al.

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