Methods and apparatus to test and compensate multi-channel...

Coded data generation or conversion – Converter compensation

Reexamination Certificate

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C341S144000

Reexamination Certificate

active

07868794

ABSTRACT:
Methods and apparatus to test and compensate multi-channel digital-to-analog converters (DACs) are described. In some examples, a multi-channel digital-to-analog converter (DAC) and an error detector are implemented in an integrated circuit. The multi-channel DAC includes a first DAC channel configured to generate a first analog representation of a digital input signal, and a second DAC channel configured to generate a second analog representation of the digital input signal. The error detector is configured to compare the first analog representation and the second analog representation to generate a difference signal, and to output a signal indicative of whether the difference signal is greater than a predetermined threshold.

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patent: 2009/0128382 (2009-05-01), Matsukawa et al.
patent: 06021816 (1994-01-01), None
Burns et al., “An Introduction to Mixed-Signal IC Test and Measurement,” Chapter 9, pp. 315-320 and 350-364, Oxford University Press, New York, New York, 2001.
Arabi et al., “On Chip Testing Data Converters Using Static Parameters,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 6, No. 3, Sep. 1998, pp. 409-419.

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